SN74BCT8374ANTG4 - IC SCAN TEST DEVICE W/FF 24-DIP

typové označenie

SN74BCT8374ANTG4

Vnútorné Part Number

ABC-SN74BCT8374ANTG4

Výrobca

T-I

Stručný popis

IC SCAN TEST DEVICE W/FF 24-DIP

stav RoHS

Bezolovnaté / V súlade s normou RoHS

dodacia lehota

1-2 dni

K dispozícii Množstvo

58833 Pieces

referenčná cena

~~USD 0~~

Naša cena

- (prosím, kontaktujte nás za lepšiu cenu: [email protected])

ABC Semiconductor majú SN74BCT8374ANTG4 na sklade na predaj.

Lodné možnosti a lodné čas:: DHL: 2-3 days.; FEDEX: 2-3 days.; UPS: 2-4 days.; TNT: 3-5 days.; EMS: 5-8 days.; Normal Post: 10-15 days.

Možnosti platby:: Paypal (Credit Card); Bank Transfer (Wire Transfer); Western Union; MoneyGram

špecifikácia SN74BCT8374ANTG4

záruka kvality : 365 dní záruka

sklad Resource : Franšízovanej Distribútor / Výrobca Direct

Krajina pôvodu : USA / TAIWAN / MEXICO / MALAYSIA / PHI

Číslo dielu : SN74BCT8374ANTG4

Výrobca : T-I

popis : IC SCAN TEST DEVICE W/FF 24-DIP

séria : 74BCT

Stav časti : Obsolete

Typ logiky : Scan Test Device with D-Type Edge-Triggered Flip-Flops

Napájacie napätie : 4.5V ~ 5.5V

Počet bitov : 8

Prevádzková teplota : 0°C ~ 70°C

Typ montáže : Through Hole

Balík / Prípad : 24-DIP (0.300", 7.62mm)

Dodávateľský balík zariadení : 24-PDIP

závažia : -

podmienka : Nové a originálne

súvisiace odkazy : SN74B , SN74BCT8

dokumenty pre SN74BCT8374ANTG4

listoch : SN74BCT8374ANTG4.pdf

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